CVE Database · CVE-2018-11279
CVSS v3.1
N/A
EPSS
0.51%
Published
Jan 18, 2019
Modified
Nov 21, 2024
Public PoC / Exploit (1)
All weaponized →Links to public security research (Exploit-DB, Nuclei, Trickest, GitHub) for defensive use only.
Description
Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130
Weaknesses (CWE)
Affected Products (92)
References (4)
...and 42 more
