CVE Database · CVE-2018-13888
CVSS v3.1
N/A
EPSS
0.23%
Published
Feb 11, 2019
Modified
Nov 21, 2024
Public PoC / Exploit (1)
All weaponized →Links to public security research (Exploit-DB, Nuclei, Trickest, GitHub) for defensive use only.
Description
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
Weaknesses (CWE)
Affected Products (64)
References (4)
...and 14 more
